Description

The CHIPS Metrology Program at the National Institute of Standards and Technology (NIST) seeks a postdoctoral researcher motivated to improve the accuracy of nanoscale feature measurement using scanning electron microscopy (SEM). This is your opportunity to improve the accuracy of scanning electron microscopy (SEM) measurements. Accurate measurements by SEM require modeling the physics of signal production in the sample. Our team uses an SEM simulator to interpret signals. We seek measurement data to validate and improve our simulator models.

Over the past 3.5 years of our existing yield measurement project, we have built an ultra-high vacuum (UHV) system to bombard planar samples with electrons inside a spherical retarding field analyzer (RFA) and measure the ratio of emitted to incident electrons (i.e., the emitted electron yield). The yield and emitted-energy spectra are recorded as functions of beam energy and incident angle. We are looking for an experimental physicist to lead the next phase of the project, during which we plan to perform these measurements on various materials used in semiconductor electronics manufacturing. 

Job duties include:

• Processing samples through UHV cleaning procedures and verifying their cleanliness with Auger electron spectroscopy
• Performing yield measurements
• Debugging, updating, expanding, and using our in-house LabVIEW data automation code
• Modeling and correcting the measurement errors of our RFA
• Estimating measurement uncertainties
• Maintaining, calibrating, and repairing the instrument as needed

The project is funded through September 2027, so we seek someone with relevant experience who can become productive quickly.

Experience of particular interest includes:

• Demonstrated proficiency with LabVIEW
• Experience with UHV equipment, cleaning recipes, and cleaning methods
• Theory of transport and scattering of 10 eV to 10 keV electrons in condensed matter and modeling (e.g., Monte Carlo) of electrostatic analyzers (most relevantly the RFA), electron trajectories within them, and the production of backscattered or secondary electrons caused by electron collisions within the instrument (for measurement error correction)
• Data analysis, uncertainty estimation, and scientific interpretation skills

Please apply by submitting your Curriculum Vitae and statement of interest.

NIST is an equal opportunity employer.

Requirements

• Doctorate in or related to Physics, Applied Physics, Electron Microscopy, or Materials Science
• Demonstrated ability to carry out independent and collaborative research that exhibits skills relevant to this project
• U.S. citizenship is preferred, as NIST is committed to a rigorous selection process that prioritizes the appointment of U.S. citizens into research positions: https://www.nist.gov/careers/associate-positions